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Preface
Author(s) -
Erns Leiss,
Rodrigo Santos
Publication year - 2011
Publication title -
electronic notes in theoretical computer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.242
H-Index - 60
ISSN - 1571-0661
DOI - 10.1016/j.entcs.2011.11.021
Subject(s) - computer science , programming language
Optical Measurements, Modeling, and Metrology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference & Exposition on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011. The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Mechanics of Biological Systems and Materials, Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials; MEMS and Nanotechnology; Experimental and Applied Mechanics, Thermomechanics and Infra-Red Imaging, and Engineering Applications of Residual Stress.

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