Optical Constants of UV Transparent EVA and the Impact on the PV Module Output Power under Realistic Irradiation
Author(s) -
Malte Ruben Vogt,
Hendrik Holst,
Henning SchulteHuxel,
Susanne Blankemeyer,
Robert Witteck,
David Hinken,
Matthias Winter,
Byungsul Min,
Carsten Schinke,
Ingo Ahrens,
Marc Köntges,
Karsten Bothe,
Rolf Brendel
Publication year - 2016
Publication title -
energy procedia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.474
H-Index - 81
ISSN - 1876-6102
DOI - 10.1016/j.egypro.2016.07.136
Subject(s) - ethylene vinyl acetate , refractive index , materials science , irradiation , optics , wavelength , ellipsometry , ray tracing (physics) , transmission (telecommunications) , solar cell , optoelectronics , thin film , physics , composite material , computer science , nanotechnology , telecommunications , nuclear physics , copolymer , polymer
We measure and discuss the complex refractive index of conventional ethylene vinyl acetate (EVA) and an EVA with enhanced UV-transmission based on spectroscopic ellipsometry, transmission and reflection measurements over the wavelength range from 300-1200 nm. Ray tracing of entire solar cell modules using this optical data predicts a 1.3% increase in short circuit current density (Jsc) at standard test conditions for EVA with enhanced UV transmission. This is in good agreement with laboratory experiments of test modules that result in a 1.4% increase in Jsc by using a UV transparent instead of a conventional EVA. Further, ray tracing simulations with realistic irradiation conditions with respect to angular and spectral distribution reveal an even larger Jsc increase of 1.9% in the yearly average. This increase is largest in the summer months with an increase of up to 2.3%
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