Open AccessRelative ion yields measured with a high-resolution glow discharge mass spectrometer operated with an argon/hydrogen mixture
Author(s) -
R.W. Smithwick,
David W. Lynch,
John Franklin
Publication year - 1993
Publication title -
journal of the american society for mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.961
H-Index - 127
eISSN - 1879-1123
pISSN - 1044-0305
DOI - 10.1016/1044-0305(93)85092-c
Subject(s) - argon , chemistry , glow discharge , analytical chemistry (journal) , hydrogen , calibration , ion , mass spectrometry , calibration curve , resolution (logic) , plasma , detection limit , chromatography , physics , statistics , mathematics , organic chemistry , quantum mechanics , artificial intelligence , computer science
Quantitative elemental analysis by glow discharge mass spectrometry (GDMS) requires a calibration factor for each element. The calibration factors used in the present work are called relative ion yields (RIYs). The RIYs of each of 19 elements within samples of four National Institute of Standards and Technology steel reference materials (nos. 661-664) were measured using pure argon and an argon mixture containing 1.0% hydrogen by volume. The RIYs measured using pure argon correlated within a factor of approximately 2-3 to the RIYs calculated by a theoretical model. The RlYs measured for these 19 elements using the argon mixture containing 1.0% hydrogen correlated within a factor of approximately 1.3 to the calculated RIYs. These results may have significant analytical potential with respect to GDMS and may have application to other plasma techniques.