Open AccessThe development of a high resolution mass spectrometer: A reminiscence
Author(s) -
Alfred O. Nier
Publication year - 1991
Publication title -
journal of the american society for mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.961
H-Index - 127
eISSN - 1879-1123
pISSN - 1044-0305
DOI - 10.1016/1044-0305(91)80029-7
Subject(s) - chemistry , atomic mass , mass spectrometry , tandem , flexibility (engineering) , resolution (logic) , high resolution , spectrometer , hybrid mass spectrometer , analytical chemistry (journal) , atomic physics , tandem mass spectrometry , computational physics , selected reaction monitoring , optics , physics , aerospace engineering , remote sensing , chromatography , statistics , mathematics , artificial intelligence , geology , computer science , engineering
This article is a review of the events leading to the development of the double-focusing tandem mass spectrometer system, which is sometimes called the Johnson-Nier geometry. An essential feature of the geometry is that it eliminates second-order angular aberration, enhancing the sensitivity, without a loss in resolution. Flexibility in the choice of ion source and collector designs is assured because both are outside of regions of electric and magnetic fields. The vacuum housing permits high-temperature baking, ensuring ultrahigh vacuum conditions. Although introduced initially for the purpose of determining precise atomic masses, the design has found its greatest application in studies of structure of heavy molecules, making use of the high resolution to identify fragments. In many cases the composition of a molecule, or fragment, can be deduced from its exact mass by utilizing the known atomic masses of likely constituent atoms.