Enhanced backward scattering by surface plasmons on silver film
Author(s) -
Zhaowei Liu,
Dongjuan Xi,
David Pile,
Qi Luo,
Nicholas X. Fang,
Xiang Zhang
Publication year - 2007
Publication title -
applied physics a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.485
H-Index - 149
eISSN - 1432-0630
pISSN - 0947-8396
DOI - 10.1007/s00339-006-3833-4
Subject(s) - scattering , plasmon , surface plasmon , optics , polarization (electrochemistry) , excitation , materials science , surface plasmon resonance , localized surface plasmon , light scattering , chemistry , optoelectronics , nanotechnology , physics , nanoparticle , quantum mechanics
Remarkable attention has been attracted recently due to novel properties of surface plasmon and its potential applications in nanotechnology. In this work we present an angularly resolved surface plasmon scattering study on a primitive metal surface. Using a reversed attenuated total reflection (RATR) setup in the experiment, a double-crescent shaped and enhanced scattering pattern is obtained at far field. The scattering pattern as a function on the variation of angle and polarization of incident beam are studied theoretically and experimentally and good agreement between them is demonstrated. Consequently, it is shown that this angularly resolved surface plasmon scattering measurement can be employed for resolving a richness of nanoscale surface texture
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