Small sample corrections for LTS and MCD
Author(s) -
Greet Pison,
Stefan Van Aelst,
Gert Willems
Publication year - 2002
Publication title -
metrika
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.728
H-Index - 40
eISSN - 1435-926X
pISSN - 0026-1335
DOI - 10.1007/s001840200191
Subject(s) - estimator , mathematics , consistency (knowledge bases) , statistics , minimum variance unbiased estimator , covariance , consistent estimator , sample (material) , sample size determination , bias of an estimator , stein's unbiased risk estimate , strong consistency , least squares function approximation , discrete mathematics , chemistry , chromatography
The least trimmed squares estimator and the minimum covari-ance determinant estimator [5] are frequently used robust estimators of re-gression and of location and scatter. Consistency factors can be computedfor both methods to make the estimators consistent at the normal model.However, for small data sets these factors do not make the estimator un-biased. Based on simulation studies we therefore construct formulas whichallow us to compute small sample correction factors for all sample sizes anddimensions without having to carry out any new simulations. We give someexamples to illustrate the effect of the correction factor.status: publishe
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