Open AccessReliability of LED’s; Are the accelerated ageing tests reliable?
Author(s) -
G. Ferenczi
Publication year - 1981
Publication title -
acta physica academiae scientiarum hungaricae
Language(s) - English
Resource type - Journals
eISSN - 2064-3047
pISSN - 0001-6705
DOI - 10.1007/bf03159681
Subject(s) - reliability (semiconductor) , accelerated aging , ageing , electroluminescence , materials science , reliability engineering , degradation (telecommunications) , spectroscopy , stress (linguistics) , carrier lifetime , accelerated life testing , nuclear engineering , computer science , optoelectronics , physics , composite material , thermodynamics , telecommunications , statistics , mathematics , engineering , philosophy , weibull distribution , linguistics , genetics , biology , power (physics) , layer (electronics) , quantum mechanics , silicon
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