Damage threshold determination of bulk polymer samples using pulsed photothermal deflection technique | Zendy

Krishnapriya Subramonian Rajasree | Zendy; Ayeswarya Ravikumar | Zendy; P. Radhakrishnan | Zendy; V. P. N. Nampoori | Zendy; C. P. G. Vallabhan | Zendy

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Damage threshold determination of bulk polymer samples using pulsed photothermal deflection technique

Author(s) -

Krishnapriya Subramonian Rajasree,

Ayeswarya Ravikumar,

P. Radhakrishnan,

V. P. N. Nampoori,

C. P. G. Vallabhan

Publication year - 1992

Publication title -

bulletin of materials science

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.35

H-Index - 72

eISSN - 0973-7669

pISSN - 0250-4707

DOI - 10.1007/bf02927444

Subject(s) - materials science , photothermal therapy , full width at half maximum , deflection (physics) , laser , irradiation , optics , wavelength , detector , polymer , photothermal spectroscopy , pulsed laser , beam (structure) , pulse duration , optoelectronics , composite material , nanotechnology , physics , nuclear physics

Photothermal deflection technique was used for determining the laser damage threshold of polymer samples of teflon (PTFE) and nylon. The experiment was conducted using a Q-switched Nd-YAG laser operating at its fundamental wavelength (1-06μm, pulse width 10 nS FWHM) as irradiation source and a He-Ne laser as the probe beam, along with a position sensitive detector. The damage threshold values determined by photothermal deflection method were in good agreement with those determined by other methods.

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