Oxidation kinetics of reaction-sintered silicon carbide
Author(s) -
Omprakash Chakrabarti,
J. Mukerji
Publication year - 1993
Publication title -
bulletin of materials science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.35
H-Index - 72
eISSN - 0973-7669
pISSN - 0250-4707
DOI - 10.1007/bf02746043
Subject(s) - materials science , activation energy , silicon carbide , kinetics , diffusion , carbide , chemical kinetics , atmospheric temperature range , chemical engineering , oxide , silicon , oxidation process , oxygen , analytical chemistry (journal) , metallurgy , chemistry , thermodynamics , organic chemistry , physics , quantum mechanics , engineering
The oxidation kinetics of reaction-sintered silicon carbide has been studied over the temperature range 1200° to 1350°C. The material has a bulk density of 3·00 g/cm3 and the unreacted Si content is 22·5% (v/v). The activation energy for oxidation is 28·75 ± 2·61 kcal/mol. It is proposed that the diffusion of oxygen through the growing oxide film is the rate-controlling process.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom