Reaction layer formation at the graphite/copper-chromium alloy interface

Sessile drop tests were used to obtain information about copper-chromium alloys that suitably wet graphite. Characterization of graphite/copper-chromium alloy interfaces subjected to elevated temperatures were conducted using scanning electron microscopy (SEM), energy-dispersive spectroscopy (EDS), Auger electron spectroscopy (AES), and X-ray diffraction analyses. These analyses indicate that during sessile drop tests conducted at 1130 C for 1 hour, copper alloys containing greater than 0.98 at. pct chromium form continuous reaction layers of approximately 10-m thickness. The reaction layers adhere to the graphite surface. The copper wets the reaction layer to form a contact angle of 60 deg or less. X-ray diffraction results indicate that the reaction layer is chromium carbide. The kinetics of reaction layer formation were modeled in terms of bulk diffusion mechanisms. Reaction layer thickness is controlled initially by the diffusion of Cr out of the Cu alloy and later by the diffusion of C through chromium carbide.