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X-ray analysis of stacking faults in ytterbium
Author(s) -
Kalyani Vijayan
Publication year - 1988
Publication title -
journal of materials science letters
Language(s) - English
Resource type - Journals
eISSN - 1573-4811
pISSN - 0261-8028
DOI - 10.1007/bf00720754
Subject(s) - ytterbium , materials science , stacking , x ray , x ray crystallography , mineralogy , crystallography , optics , geology , diffraction , nuclear magnetic resonance , chemistry , doping , optoelectronics , physics
At room temperature ( z 300 K), ytterbium has a predominantly f c c structure [l, 21. However, a small13; amount of the h c p structure corresponding to the low- as well as the high-temperature phases [3-61 is also known to coexist [7, 81 with the room-temperature f c c structure. We have earlier reported [8] that mechanical deformation of 99.2% pure ytterbium specimens at room temperature, induces a partial structural transformation of the type f c c -+ h c p, leading to an enhancement of the h c p component in the deformed material. I t has also been found [9] that surfaces of ytterbium specimens subjected to polishing with emery or to filing also exhibit similar enhancement of the h c p component. These observations suggest that in 99.2% pure ytterbium, the f c c -+ h c p transformation which readily accompanies different types of13; mechanical treatments, is probably associated with the stacking faults in the material.

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