The georgia tech high sensitivity microwave measurement system | Zendy

David R. DeBoer | Zendy; Paul G. Steffes | Zendy

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The georgia tech high sensitivity microwave measurement system

Author(s) -

David R. DeBoer,

Paul G. Steffes

Publication year - 1996

Publication title -

astrophysics and space science

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.398

H-Index - 75

eISSN - 1572-946X

pISSN - 0004-640X

DOI - 10.1007/bf00644325

Subject(s) - physics , wavelength , microwave , sensitivity (control systems) , ranging , planet , cosmic microwave background , cosmology , remote sensing , astronomy , optics , astrophysics , geodesy , geography , engineering , electronic engineering , quantum mechanics , anisotropy

As observations and models of the planets become increasingly more accurate and sophisticated, the need for highly accurate laboratory measurements of the microwave properties of the component gases present in their atmospheres become ever more critical. This paper describes the system that has been developed at Georgia Tech to make these measurements at wavelengths ranging from 13.3 cm to 1.38 cm with a sensitivity of 0.05 dB/km at the longest wavelength and 0.6 dB/km at the shortest wavelength.

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