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Growth of epitaxial silicon layers by ion beam sputtering
Author(s) -
B. A. Unvala,
K. Pearmain
Publication year - 1970
Publication title -
journal of materials science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.813
H-Index - 177
eISSN - 1573-4803
pISSN - 0022-2461
DOI - 10.1007/bf00558187
Subject(s) - materials science , silicon , epitaxy , sputtering , ion beam , ion , optoelectronics , thin film , mineralogy , beam (structure) , nanotechnology , optics , layer (electronics) , chemistry , physics , organic chemistry
References 1. J . STEIGMAN, W. S I tOCKL E Y, and r. c. NIX, Phys. Rev. 56 (1939) 13. 2. c. LEYMONIE, "Radioactive Tracers in Physical Metallurgy". (J. Wiley and Sons, Inc., New York, 1963), pp. 54, 57. 3. T. J. RENOOF, Phil. Mag. 8 (1964) 781. 4. G. C. K U C Z Y N S K I and R. J. L A N D A U E R , J. AppL Phys. 22 (1951) 952. 5. A. ANDREWS and s. DUSHMAN, 3". Phys. Chem. 29 (1925) 462. 6. a. GOLDSTEIN, Rev. Sci. Instr. 28 (1957) 289. 7. C. E. G R O U T H A M E L a n d c . E. J O H N S O N , Analyt. Chem. 26 (1954) 1284. 8. c. P. BtrHSM~R, Ph.D. Thesis, State University of New York, College of Ceramics, Alfred, NY (1968).

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