Open Access14th IEEE VLSI Test Symposium
Publication year - 1996
Publication title -
journal of electronic testing
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.247
H-Index - 34
eISSN - 1573-0727
pISSN - 0923-8174
DOI - 10.1007/bf00136084
Subject(s) - very large scale integration , test (biology) , computer science , computer architecture , reliability engineering , embedded system , engineering , geology , paleontology
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