Parallel sequence fault simulation for synchronous sequential circuits
Author(s) -
Chen-Pin Kung,
Chen-Shang Lin
Publication year - 1996
Publication title -
journal of electronic testing
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.247
H-Index - 34
eISSN - 1573-0727
pISSN - 0923-8174
DOI - 10.1007/bf00134691
Subject(s) - parallel computing , sequential logic , fault simulator , computer science , benchmark (surveying) , speedup , sequence (biology) , electronic circuit , algorithm , logic simulation , combinational logic , fault (geology) , overhead (engineering) , partition (number theory) , stuck at fault , parallel algorithm , fault detection and isolation , logic gate , mathematics , engineering , artificial intelligence , geography , actuator , biology , genetics , operating system , geodesy , combinatorics , seismology , electrical engineering , geology
A novel parallel sequence fault simulation (PSF) algorithm for synchronous sequential circuits is presented. The algorithm successfully extend the parallel pattern method for combinational circuits to sequential circuits by proposing a multiple-pass mechanism to overcome the state dependency in sequential circuits. The fault simulation is performed in parallel by partitioning the entire sequence into subsequences of equal length. Furthermore, techniques are developed to minimize the number of simulation passes. Notably, two compact counters, and , are proposed to faciliate the early stabilization detection of faulty circuit simulation with minimum space overhead. The experimental results on the benchmark circuits show that the speedup ratio over a serial sequence fault simulator based on ROOFS is 9.16 on average for pseudo random vectors. The parallel sequence algorithm of PSF is especially adaptable to parallel and distributed simulation which exploits sequence partition.
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