Classification Enhancement via Biometric Pattern Perturbation
Author(s) -
Terry P. Riopka,
Terrance E. Boult
Publication year - 2005
Publication title -
lecture notes in computer science
Language(s) - English
Resource type - Book series
SCImago Journal Rank - 0.249
H-Index - 400
eISSN - 1611-3349
pISSN - 0302-9743
ISBN - 3-540-27887-7
DOI - 10.1007/11527923_89
Subject(s) - computer science , biometrics , artificial intelligence , pattern recognition (psychology) , classifier (uml) , facial recognition system , wavelet , face (sociological concept) , artificial neural network , machine learning , social science , sociology
This paper presents a novel technique for improving face recognition performance by predicting system failure, and, if necessary, perturbing eye coordinate inputs and repredicting failure as a means of selecting the optimal perturbation for correct classification. This relies on a method that can accurately identify patterns that can lead to more accurate classification, without modifying the classification algorithm itself. To this end, a neural network is used to learn 'good' and 'bad' wavelet transforms of similarity score distributions from an analysis of the gallery. In production, face images with a high likelihood of having been incorrectly matched are reprocessed using perturbed eye coordinate inputs, and the best results used to “correct” the initial results. The overall approach suggest a more general approach involving the use of input perturbations for increasing classifier performance in general. Results for both commercial and research face-based biometrics are presented using both simulated and real data. The statistically significant results show the strong potential for this to improve system performance, especially with uncooperative subjects.
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