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Revisiting degradation in the XPS analysis of polymers
Author(s) -
Morgan David J.,
Uthayasekaran Sharukaa
Publication year - 2022
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.7151
Subject(s) - x ray photoelectron spectroscopy , degradation (telecommunications) , polymer , chemistry , polymer degradation , analytical chemistry (journal) , chemical engineering , materials science , environmental chemistry , organic chemistry , computer science , telecommunications , engineering
A study on the degradation of both halogenated and non‐halogenated polymers has been made by x‐ray photoelectron spectroscopy on two different types of common place photoelectron spectrometer. The degradation results herein are compared with the degradation index of Beamson and Briggs, and a notable difference was observed. The effects of neutraliser and spot size on the degradation kinetics are explored and lead to simple recommendations for the successful analysis of damage‐susceptible polymers.