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Measurement of surface orientations of transparent objects using polarization in highlight
Author(s) -
Saito Megumi,
Sato Yoichi,
Ikeuchi Katsushi,
Kashiwagi Hiroshi
Publication year - 2001
Publication title -
systems and computers in japan
Language(s) - English
Resource type - Journals
eISSN - 1520-684X
pISSN - 0882-1666
DOI - 10.1002/scj.1027
Subject(s) - specular reflection , optics , light source , polarization (electrochemistry) , reflection (computer programming) , specular highlight , light reflection , surface (topology) , object (grammar) , diffuse reflection , physics , context (archaeology) , computer science , materials science , artificial intelligence , geometry , mathematics , geology , chemistry , paleontology , programming language
There are no simple noncontact methods available to measure a transparent object's shape. In this context, the authors suggest highlight polarization analysis as a method for noncontact measurement of the transparent object's shape. Highlight is the light observed as specular reflection component, which is the part of reflected light that remains nearly unchanged (that is, very much similar to source light). Highlight, however, is only observed near the direction of regular reflection, which normally covers just a small part of the object's surface. As a solution, use of spherical area light source is offered; with such a light source, normal direction can be found across the whole object's surface without any contact. © 2001 Scripta Technica, Syst Comp Jpn, 32(5): 64–71, 2001

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