A Further Improvement in the Gaussian ϕ(ϱ) Approach for Matrix Correction in Quantitative Electron Probe Microanalysis | Zendy

Bastin G. F. | Zendy; Heijligers H. J. M. | Zendy; van Loo F. J. J. | Zendy

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A Further Improvement in the Gaussian ϕ(ϱ) Approach for Matrix Correction in Quantitative Electron Probe Microanalysis

Author(s) -

Bastin G. F.,

Heijligers H. J. M.,

van Loo F. J. J.

Publication year - 1986

Publication title -

scanning

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.359

H-Index - 47

eISSN - 1932-8745

pISSN - 0161-0457

DOI - 10.1002/sca.4950080204

Subject(s) - electron probe microanalysis , microanalysis , gaussian , matrix (chemical analysis) , electron , complex matrix , value (mathematics) , analytical chemistry (journal) , computer science , computational physics , statistical physics , optics , physics , chemistry , nuclear physics , quantum mechanics , scanning electron microscope , chromatography , machine learning , organic chemistry

An improved correction model for quantitative electron probe microanalysis, based on modifications of the Gaussian ϕ(ϱ) approach, originally introduced by Packwood and Brown , is presented. The improvements consist of better equations for the input parameters of this model which have been obtained by fitting to experimental ϕ(ϱ) data. The new program has been tested on 627 measurements for medium to heavy elements (Z>11) and on 117 carbon measurements with excellent results: an r.m.s. value of 2.99% in the former case and 4.1% in the latter. Finally the new program has been compared to five other current correction programs which were found to perform less satisfactorily.

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