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Nanoscale Mapping of Semi‐Crystalline Polypropylene
Author(s) -
Abrams Kerry J.,
Wan Quan,
Stehling Nicola A.,
Jiao C.,
Talari Abdullah C. S,
Rehman Ihtesham,
Rodenburg Cornelia
Publication year - 2017
Publication title -
physica status solidi c
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 46
eISSN - 1610-1642
pISSN - 1862-6351
DOI - 10.1002/pssc.201700153
Subject(s) - nanoscopic scale , hyperspectral imaging , polypropylene , scanning electron microscope , materials science , chemical imaging , nanotechnology , electron microscope , optics , remote sensing , composite material , geology , physics
We reveal nanoscale information of semi‐crystalline polypropylene with the use of a new secondary electron hyperspectral imaging technique. The innovative combination of cryo‐SEM and low voltage allows for the optimized imaging of these beam‐sensitive materials. Through the collection of secondary electron hyperspectral imaging data, mapping of molecular order on the nano‐scale in the scanning electron microscope (SEM) can be achieved.

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