Study of carrier dynamics and radiative efficiency in InGaN/GaN LEDs with Monte Carlo method
Author(s) -
Lu ILin,
Wu YuhRenn,
Singh Jasprit
Publication year - 2011
Publication title -
physica status solidi c
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 46
eISSN - 1610-1642
pISSN - 1862-6351
DOI - 10.1002/pssc.201001054
Subject(s) - monte carlo method , radiative transfer , light emitting diode , leakage (economics) , quantum efficiency , materials science , indium , optoelectronics , non radiative recombination , dislocation , trapping , charge carrier density , carrier lifetime , doping , semiconductor , physics , optics , silicon , semiconductor materials , ecology , statistics , mathematics , biology , economics , composite material , macroeconomics
In this paper, we have applied the Monte Carlo method to study carrier dynamics in InGaN quantum well. Vertical and lateral transport and its impact on device radiative efficiency is studied for different In compositions, dislocation densities, temperatures, and carrier densities. Our results show that the non‐radiative recombination caused by the defect trapping plays a dominating role for higher indium composition and this limits the internal quantum efficiency (IQE). For lower indium composition cases, carrier leakage plays some role in the mid to high injection conditions and carrier leakage is strong in very high carrier density in all cases. Our results suggest that reducing the trap density and QCSE are still the key factors to improve the IQE. The paper examines the relative roles of leakage and non‐radiative processes on IQE. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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