Order‐disorder transitions in self‐assembled polymers: A positron annihilation study | Zendy

Ramani Ramasubbu | Zendy; Valkama Sami | Zendy; Kilpeläinen Simo | Zendy; Tumisto Filip | Zendy; Brinke Gerrit ten | Zendy; Ruokolainen Janne | Zendy; Alam Sarfaraz | Zendy; Ikkala Olli | Zendy

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Order‐disorder transitions in self‐assembled polymers: A positron annihilation study

Author(s) -

Ramani Ramasubbu,

Valkama Sami,

Kilpeläinen Simo,

Tumisto Filip,

Brinke Gerrit ten,

Ruokolainen Janne,

Alam Sarfaraz,

Ikkala Olli

Publication year - 2009

Publication title -

physica status solidi c

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.21

H-Index - 46

eISSN - 1610-1642

pISSN - 1862-6351

DOI - 10.1002/pssc.200982079

Subject(s) - differential scanning calorimetry , lamellar structure , supramolecular chemistry , polymer , materials science , amphiphile , self assembly , positron annihilation spectroscopy , polymer chemistry , scattering , supramolecular polymers , crystallography , chemical physics , chemical engineering , nanotechnology , positron annihilation , positron , copolymer , chemistry , thermodynamics , physics , optics , crystal structure , composite material , nuclear physics , engineering , electron

We report here the first results of order‐disorder transition (ODT) in a self‐assembled comb‐like polymer‐amphiphile supramolecular system as identified from the change in positron lifetime parameters. We have used poly(4‐vinyl pyridine) hydrogen bonded with 3‐pentadecyl phenol, which upon heating showed a stepwise reduction in o ‐Ps intensity at the ODT from lamellar self‐assembled state to the disordered state. The ODT temperature was confirmed by differential scanning calorimetry and small angle X‐ray scattering. The free volume “holes” in this polymer‐amphiphile system are proposed to be near the chain ends of the polymer backbones. We suggest that positron lifetime spectroscopy can serve as a technique to identify ODTs in self‐assembled lamellar structured supramolecular systems. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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