InN{0001} polarity by ion scattering spectroscopy | Zendy

Walker M. | Zendy; Veal T. D. | Zendy; Lu Hai | Zendy; Schaff W. J. | Zendy; McConville C. F. | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

InN{0001} polarity by ion scattering spectroscopy

Author(s) -

Walker M.,

Veal T. D.,

Lu Hai,

Schaff W. J.,

McConville C. F.

Publication year - 2005

Publication title -

physica status solidi (c)

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.21

H-Index - 46

eISSN - 1610-1642

pISSN - 1610-1634

DOI - 10.1002/pssc.200461290

Subject(s) - ion , polarity (international relations) , wurtzite crystal structure , scattering , spectroscopy , polar , sapphire , materials science , spectral line , molecular physics , chemistry , analytical chemistry (journal) , optics , hexagonal crystal system , crystallography , physics , laser , biochemistry , organic chemistry , chromatography , quantum mechanics , astronomy , cell

The polarity of a wurtzite InN thin film grown on a c‐plane sapphire substrate with GaN and AlN buffer layers has been investigated by co‐axial impact collision ion scattering spectroscopy (CAICISS). Time of flight (TOF) spectra of He + ions scattered from the surface of the InN film were taken as a function of the incident angles of the primary 3 keV He + ions. From the TOF spectra, the polar angle‐dependence of the In scattered intensity was obtained. Comparison of the experimental polar‐angle dependence of the In CAICISS signal intensity with simulated results for the various volume ratios of (0001)‐ and (000 $ \bar 1 $ )‐polarity domains indicated that the InN film is approximately 75% In‐polarity and 25% N‐polarity. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research