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Material profile influences in bulk‐heterojunctions
Author(s) -
Roehling John D.,
Rochester Christopher W.,
Ro Hyun Wook,
Wang Peng,
Majewski Jaroslaw,
Batenburg K. Joost,
Arslan Ilke,
Delongchamp Dean M.,
Moulé Adam J.
Publication year - 2014
Publication title -
journal of polymer science part b: polymer physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.65
H-Index - 145
eISSN - 1099-0488
pISSN - 0887-6266
DOI - 10.1002/polb.23564
Subject(s) - fullerene , materials science , annealing (glass) , reflectometry , heterojunction , transmission electron microscopy , neutron reflectometry , scanning transmission electron microscopy , dark field microscopy , analytical chemistry (journal) , electron tomography , cathode , scanning electron microscope , optics , microscopy , nanotechnology , composite material , chemistry , neutron scattering , optoelectronics , physics , small angle neutron scattering , scattering , time domain , computer science , chromatography , computer vision , organic chemistry
The morphology in mixed bulk‐heterojunction films are compared using three different quantitative measurement techniques. We compare the vertical composition changes using high‐angle annular dark‐field scanning transmission electron microscopy with electron tomography and neutron and x‐ray reflectometry. The three measurement techniques yield qualitatively comparable vertical concentration measurements. The presence of a metal cathode during thermal annealing is observed to alter the fullerene concentration throughout the thickness of the film for all measurements. However, the absolute vertical concentration of fullerene is quantitatively different for the three measurements. The origin of the quantitative measurement differences is discussed. © 2014 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2014 , 52 , 1291–1300

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