Damage of semicrystalline polyamide 6 assessed by 3D X‐ray tomography: From microstructural evolution to constitutive modeling
Author(s) -
Laiarinandrasana L.,
Morgeneyer T. F.,
Proudhon H.,
Regrain C.
Publication year - 2010
Publication title -
journal of polymer science part b: polymer physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.65
H-Index - 145
eISSN - 1099-0488
pISSN - 0887-6266
DOI - 10.1002/polb.22043
Subject(s) - materials science , ultimate tensile strength , crystallinity , composite material , polyamide , creep , void (composites) , tomography , volume fraction , tensile testing , polymer , physics , optics
In this study an attempt is made to link the damage and microstructural evolution of semicrystalline polymers, in particular polyamide 6, to the macroscopic material behavior during tensile and creep tests. Tensile specimens, removed before failure were seen to have undergone striction. They were examined using synchrotron radiation tomography. These samples showed elongated axisymmetric columns of voids separated by thin ligaments of material. These observations were confirmed and refined through a cryofractography experiment of a different tensile sample, stopped before failure. An attempt was made to obtain quantitative data about void volume fraction and morphology through image analysis. © 2010 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 48: 1516–1525, 2010
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