Electron spin resonance studies of anisotropy in semiconducting polymeric films

X‐band electron spin resonance was employed to study the structural anisotropy in several polythiophene derivatives. Because of the dominating homogeneous width, the obtained absorption spectra were Lorentzian‐shaped. Information about the structural anisotropy was obtained from the position and width of the absorption peak. Qualitatively, the anisotropy was in full agreement with earlier results from X‐ray diffraction, including a flip in molecular orientation with respect to the film substrate between solution‐cast and spin‐cast films. With the Monte Carlo technique, the spectra were fitted with a biaxial g tensor, an anisotropy parameter S , and an intrinsic width σ. The simulations showed that g could be treated as pseudo‐uniaxial, with the unique axis along the side chains rather than along the ring normal. Closed‐form analytical expressions relating g to the anisotropy were obtained and used for a quantitative assessment of the molecular anisotropy. Because the molecular g tensor for these materials was not known, a known value of S for one of the samples obtained by X‐ray diffraction was used for normalization. Fairly consistent values were obtained for both g and S . © 2003 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 41: 3011–3025, 2003