Open AccessA scanning electron microscope for ultracold atoms
Author(s) -
Gericke T.,
Utfeld C.,
Hommerstad N.,
Ott H.
Publication year - 2006
Publication title -
laser physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.59
H-Index - 72
eISSN - 1612-202X
pISSN - 1612-2011
DOI - 10.1002/lapl.200610028
Subject(s) - ionization , electron , atomic physics , ion , ultracold atom , resolution (logic) , sensitivity (control systems) , materials science , scanning electron microscope , electron microscope , physics , quantum , optics , computer science , quantum mechanics , artificial intelligence , electronic engineering , engineering
We propose a new technique for the detection of single atoms in ultracold quantum gases. The technique is based on scanning electron microscopy and employs the electron impact ionization of trapped atoms with a focused electron probe. Subsequent detection of the resulting ions allows for the reconstruction of the atom's position. This technique is expected to achieve a much better spatial resolution compared to any optical detection method. In combination with the sensitivity to single atoms, it makes new in situ measurements of atomic correlations possible. The detection principle is also well suited for the addressing of individual sites in optical lattices. (© 2006 by Astro, Ltd. Published exclusively by WILEY‐VCH Verlag GmbH & Co. KGaA)