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A Process‐Structure Investigation of Aluminum Oxide and Oxycarbide Thin Films prepared by Direct Liquid Injection CVD of Dimethylaluminum Isopropoxide (DMAI)
Author(s) -
Baggetto Loïc,
Charvillat Cédric,
Esvan Jérôme,
Thébault Yannick,
Samélor Diane,
Vergnes Hugues,
Caussat Brigitte,
Gleizes Alain,
Vahlas Constantin
Publication year - 2015
Publication title -
chemical vapor deposition
Language(s) - English
Resource type - Journals
eISSN - 1521-3862
pISSN - 0948-1907
DOI - 10.1002/cvde.201507190
Subject(s) - stoichiometry , amorphous solid , oxide , materials science , thin film , hydroxide , chemical vapor deposition , chemical engineering , aluminium , deposition (geology) , inorganic chemistry , carbide , chemistry , metallurgy , nanotechnology , organic chemistry , paleontology , sediment , engineering , biology
We present the direct liquid injection CVD of aluminum oxide and oxycarbide thin films using dimethylaluminum isopropoxide at high process temperature (500–700 °C) with the addition of O 2 gas, and at low temperature (150–300 °C) with the addition of H 2 O vapor. Very smooth films with typical roughness values lower than 2 nm are obtained. The thin films are composed of an amorphous material. The composition evolves as a function of temperature from that of a partial hydroxide to a stoichiometric oxide at low deposition temperature (150–300 °C), and from that of a stoichiometric oxide to a mixture of an oxide with an (oxy) carbide at higher temperature (500–700 °C).

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