Open AccessAnalytical Quantification and Effect of Microstructure Development in Thick Film Resistor Processing
Author(s) -
Byung-Soo Lee
Publication year - 2012
Publication title -
maikeuro jeonja mit paekijing hakoeji/ma'ikeu'ro jeonja mic pae'kijing haghoeji
Language(s) - English
Resource type - Journals
eISSN - 2287-7525
pISSN - 1226-9360
DOI - 10.6117/kmeps.2012.19.4.033
Subject(s) - resistor , microstructure , materials science , development (topology) , composite material , electrical engineering , engineering , mathematics , voltage , mathematical analysis