Open AccessSpatial mesh-based surface source model for the electron contamination of an 18 MV photon beams
Author(s) -
Ahad Ollah Ezzati,
Matthew T. Studenski,
Masuomeh Gohari
Publication year - 2020
Publication title -
journal of medical physics/journal of medical physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.292
H-Index - 24
eISSN - 1998-3913
pISSN - 0971-6203
DOI - 10.4103/jmp.jmp_29_20
Subject(s) - contamination , monte carlo method , flattening , photon , electron , component (thermodynamics) , upstream (networking) , physics , computational physics , optics , computer science , mathematics , statistics , nuclear physics , ecology , computer network , astronomy , biology , thermodynamics
Source modeling is an approach to reduce computational burden in Monte Carlo simulations but at the cost of reduced accuracy. Although this method can be effective, one component of the source model that is exceptionally difficult to model is the electron contamination, a significant contributor to the skin and shallow dose.