Open AccessEnvelopment technique and topographic overlays in bite mark analysis
Author(s) -
Parimala Djeapragassam,
Mariappan Jonathan Daniel,
Subramanian Vasudevan Srinivasan,
Ramadoss Koliyan,
Vannathan Kumaran Jimsha
Publication year - 2015
Publication title -
journal of forensic dental sciences
Language(s) - English
Resource type - Journals
eISSN - 0975-2137
pISSN - 0975-1475
DOI - 10.4103/0975-1475.172427
Subject(s) - overlay , reliability (semiconductor) , computer science , statistics , matching (statistics) , engineering , reliability engineering , mathematics , power (physics) , physics , quantum mechanics , programming language
The aims and objectives of our study were to compare four sequential overlays generated using the envelopment technique and to evaluate inter- and intraoperator reliability of the overlays obtained by the envelopment technique.