z-logo
open-access-imgOpen Access
EFFECT OF REFLECTOR DEFORMATION ON OPTICAL DETECTION SENSITIVITY FOR OPTICAL READOUT INFRARED IMAGING SYSTEM
Author(s) -
Jie Gao,
Qingchuan Zhang,
Dapeng Chen,
Binbin Jiao,
Haitao Shi,
Jian Qian,
Teng Cheng,
Xiaoping Wu
Publication year - 2009
Publication title -
journal of infrared and millimeter waves
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.206
H-Index - 27
ISSN - 1001-9014
DOI - 10.3724/sp.j.1010.2009.00249
Subject(s) - reflector (photography) , infrared , sensitivity (control systems) , optics , deformation (meteorology) , optical imaging , materials science , remote sensing , physics , geology , light source , electronic engineering , engineering , composite material

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom