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Estudio de Confiabilidad en Diodos Basados en AlGaN/GaN Durante el Estado de Encendido
Author(s) -
Eliana Acurio,
Lionel Trojman,
Brice De Jaeger,
Benoit Bakeroot
Publication year - 2022
Publication title -
revista politécnica
Language(s) - Spanish
Resource type - Journals
eISSN - 2477-8990
pISSN - 1390-0129
DOI - 10.33333/rp.vol50n1.03
Subject(s) - humanities , physics , art , cartography , geography

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