z-logo
open-access-imgOpen Access
APPLICATION OF X-RAY MICROTOMOGRAPHY FOR RESEARCHING POROSITY OF COMPOSITE MATERIALS IN POWER ELECTRONICS
Author(s) -
К. Н. Нищев,
M. I. Novopoltsev,
B.F. Mamin,
В. В. Елисеев,
JSC «Eleсtrovipryamitel»,
V.A. Martynenko,
JSC «Eleсtrovipryamitel»
Publication year - 2016
Publication title -
university proceedings volga region physical and mathematical sciences
Language(s) - English
Resource type - Journals
ISSN - 2072-3040
DOI - 10.21685/2072-3040-2016-2-10
Subject(s) - porosity , materials science , composite number , x ray microtomography , electronics , power electronics , composite material , nanotechnology , engineering physics , power (physics) , engineering , optics , physics , electrical engineering , quantum mechanics

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom