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Reliability and Validity of the Chen ADHD Scale (C-ADHDS)
Author(s) -
YiLung Chen,
Vincent ChinHung Chen,
Michael Gossop
Publication year - 2021
Publication title -
neuropsychiatric disease and treatment
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.819
H-Index - 67
eISSN - 1178-2021
pISSN - 1176-6328
DOI - 10.2147/ndt.s292696
Subject(s) - convergent validity , intraclass correlation , impulsivity , attention deficit hyperactivity disorder , reliability (semiconductor) , construct validity , scale (ratio) , clinical psychology , receiver operating characteristic , medicine , concurrent validity , psychometrics , psychology , psychiatry , internal consistency , cartography , power (physics) , physics , quantum mechanics , geography
This study aimed to establish the Chen ADHD Scale and to examine its reliability and validity.

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