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16.3: Ion‐Induced Secondary Electron Emission: A Comparative Study
Author(s) -
Elsbergen Volker,
Bachmann Peter K.,
Juestel Thomas
Publication year - 2000
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1832922
Subject(s) - lissajous curve , ion , electron affinity (data page) , atomic physics , electron , ionization , secondary emission , secondary electrons , materials science , chemistry , physics , optics , nuclear physics , organic chemistry , molecule
Abstract Ion‐induced secondary electron emission coefficients for Ne, Ar, and Xe discharges are reproducibly determined using V‐Q Lissajous figures. The comparison of measured and calculated Paschen curves results in ion‐induced γ‐coefficients for glass, MgO, CVD diamond, and phosphors. The measured γ‐values correlate well with a simple model based on the ionization energy of the gas ion and the band gap and electron affinity of the solid.