Open AccessUsing Scattered Radiation Method in element analysis of sediments by total reflection X-ray fluorescence
Author(s) -
Galina V. Pashkova,
Maria M. Mukhamedova,
Т. С. Айсуева,
А. L. Finkelshtein,
А. А. Щетников
Publication year - 2018
Publication title -
analitika i kontrolʹ
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.167
H-Index - 6
eISSN - 2073-1450
pISSN - 2073-1442
DOI - 10.15826/analitika.2018.22.2.004
Subject(s) - x ray fluorescence , total internal reflection , radiation , fluorescence , analytical chemistry (journal) , materials science , intensity (physics) , x ray , slurry , internal standard , certified reference materials , optics , chemistry , mass spectrometry , detection limit , physics , chromatography , optoelectronics , composite material