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Using Scattered Radiation Method in element analysis of sediments by total reflection X-ray fluorescence
Author(s) -
Galina V. Pashkova,
М. М. Mukhamedova,
Т. С. Айсуева,
А. L. Finkelshtein,
А. А. Shchetnikov
Publication year - 2018
Publication title -
analitika i kontrolʹ
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.167
H-Index - 6
eISSN - 2073-1450
pISSN - 2073-1442
DOI - 10.15826/analitika.2018.22.2.004
Subject(s) - x ray fluorescence , radiation , x ray , fluorescence , optics , reflection (computer programming) , physics , total internal reflection , computer science , programming language

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