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Input ion optics of inductively coupled plasma quadrupole mass spectrometers. Part 3. Asymmetrical systems with local arc-shaped ion deflection
Author(s) -
V. T. Surikov
Publication year - 2015
Publication title -
analitika i kontrolʹ
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.167
H-Index - 6
eISSN - 2073-1450
pISSN - 2073-1442
DOI - 10.15826/analitika.2015.19.2.007
Subject(s) - ion , electron optics , ion source , electrostatic lens , mass spectrometry , optics , quadrupole , quadrupole mass analyzer , deflection (physics) , inductively coupled plasma , spectrometer , ion beam , materials science , atomic physics , ion current , physics , ionization , electron , chemistry , plasma , beam (structure) , nuclear physics , quantum mechanics

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