Open AccessSnapshot Image Mapping Spectrometer (IMS) with high sampling density for hyperspectral microscopy
Author(s) -
Liang Gao,
Robert T. Kester,
Nathan Hagen,
Tomasz S. Tkaczyk
Publication year - 2010
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.18.014330
Subject(s) - hyperspectral imaging , spectral imaging , imaging spectrometer , optics , data cube , spectrometer , image resolution , chemical imaging , microscopy , snapshot (computer storage) , full spectral imaging , spectral resolution , sampling (signal processing) , physics , materials science , remote sensing , spectral line , detector , computer science , geology , quantum mechanics , astronomy , operating system
A snapshot Image Mapping Spectrometer (IMS) with high sampling density is developed for hyperspectral microscopy, measuring a datacube of dimensions 285 x 285 x 60 (x, y, lambda). The spatial resolution is approximately 0.45 microm with a FOV of 100 x 100 microm(2). The measured spectrum is from 450 nm to 650 nm and is sampled by 60 spectral channels with average sampling interval approximately 3.3 nm. The channel's spectral resolution is approximately 8nm. The spectral imaging results demonstrate the potential of the IMS for real-time cellular fluorescence imaging.