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The structured illumination microscopy using unknown speckle patterns hasshown the capacity to surpass the Abbe's diffraction barrier, giving thepossibility to design cheap and versatile SIM devices. However, thestate-of-the-art joint reconstruction methods in this framework has arelatively low contrast in super-resolution part in comparison to conventionalSIM and the hyper-parameter is not easy to tune. In this paper, a unified jointreconstruction approach is proposed with the hyper-parameter proportional tothe noise level. Different regularization terms could be evaluated under thesame model. Moreover, the degradation entailed by out-of-focus light could besolved in speckle illumination setup easily.

A unified joint reconstruction approach in structured illumination microscopy using unknown speckle patterns