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This article presents a modified compact model of resistive random access memory (RRAM) with a tunneling barrier. The bilayer modulated RRAM can be integrated into a higher density array, reducing leakage current in standby mode. The model demonstrates current transition behavior from low- to high-bias regions by considering both bulk-limited and electrode-limited transport mechanisms. This model can evaluate RRAM array performance under various pulsing conditions and device parameter variations with calibrated model cards. The compute-in-memory application requires precise current sum results hindered by the wire resistance loading effect. This study also evaluates various sizes of arrays suitable for performance improvement.

Modeling of Bilayer Modulated RRAM and Its Array Performance for Compute-in-Memory Applications