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This article presents a bipolar junction transistor (BJT)-based smart temperature sensor employing a noise-shaping successive-approximation-register (SAR) analog-to-digital converter (ADC). This approach, never explored before within a temperature sensing system, was chosen to exploit the low energy/conversion benefit peculiar to SAR-based solutions while overcoming their quantization-dominated resolution with an error-feedback technique. In addition, the system features a complete current-mode architecture enabling op-amp less signal processing and resulting in a highly compact design. Developed and fabricated in a standard 180-nm CMOS process, the sensor exhibits an active area of    $\mathrm {0.057~\text{mm}^2}$    and draws a 34-   $\mu \text{A}$    total current from a 1.8-V supply. Experimental results in the    $\mathrm {-50~ \text {C}}$    to    $\mathrm {110~ \text {C}}$    sensing range demonstrate a 92-mK resolution in a conversion time of    $\mathrm {80~ {\mu } \text { s}}$   .

An Area-Efficient Smart Temperature Sensor Based on a Fully Current Processing Error-Feedback Noise-Shaping SAR ADC in 180-nm CMOS