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Analyser‐based phase‐contrast imaging (ABPCI) is a highly sensitive phase‐contrast imaging method that produces high‐contrast images of weakly absorbing materials. However, it is only sensitive to phase gradient components lying in the diffraction plane of the analyser crystal [ i.e.  in one dimension (1‐D)]. In order to accurately account for and measure phase effects produced by the wavefield‐sample interaction, ABPCI and other 1‐D phase‐sensitive methods must achieve 2‐D phase gradient sensitivity. An inclined geometry method was applied to a Laue geometry setup for X‐ray ABPCI through rotation of the detector and object about the optical axis. This allowed this traditionally 1‐D phase‐sensitive phase‐contrast method to possess 2‐D phase gradient sensitivity. Tomographic datasets were acquired over 360° of a multi‐material phantom with the detector and sample tilted by 8°. The real and imaginary parts of the refractive index were reconstructed for the phantom.

Tomographic reconstruction using tilted Laue analyser‐based X‐ray phase‐contrast imaging