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An unparalleled resolution is reported with an inelastic X‐ray scattering instrument at the Cu  K ‐edge. Based on a segmented concave analyzer, featuring single‐crystal quartz (SiO 2 ) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four‐bounce Si(553) high‐resolution monochromator and focusing Kirkpatrick–Baez optics. The measured resolution agrees with the ray‐tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single‐crystal.

Resonant inelastic X‐ray scattering spectrometer with 25 meV resolution at the Cu K ‐edge