An orientation‐matrix approach to Laue indexing

A Laue indexing method is described which employs an orientation‐matrix approach; it is especially suited for use in the case of a diffractometer equipped with a position‐ and energy‐sensitive detector at a pulsed neutron source or synchrotron X‐ray source. The crystal can be in any orientation and lattice constants need not be known. Using this method positional and wavelength information can be easily converted into a form suitable for an automatic indexing procedure in order to obtain indices and an orientation matrix, or with knowledge of the latter to predict positions of reflections incident on a detector centered at any desired 2 θ .