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An orientation‐matrix approach to Laue indexing
Author(s) -
Jacobson R. A.
Publication year - 1986
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889886089343
Subject(s) - orientation (vector space) , diffractometer , detector , search engine indexing , optics , synchrotron , position (finance) , matrix (chemical analysis) , physics , computer science , materials science , geometry , mathematics , artificial intelligence , scanning electron microscope , finance , economics , composite material
A Laue indexing method is described which employs an orientation‐matrix approach; it is especially suited for use in the case of a diffractometer equipped with a position‐ and energy‐sensitive detector at a pulsed neutron source or synchrotron X‐ray source. The crystal can be in any orientation and lattice constants need not be known. Using this method positional and wavelength information can be easily converted into a form suitable for an automatic indexing procedure in order to obtain indices and an orientation matrix, or with knowledge of the latter to predict positions of reflections incident on a detector centered at any desired 2 θ .