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A conical‐type X‐ray guide tube for diffraction experiments with small crystals
Author(s) -
Nozaki H.,
Nakazawa H.
Publication year - 1986
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889886088969
Subject(s) - conical surface , diffraction , optics , intensity (physics) , x ray , x ray crystallography , materials science , tube (container) , beam (structure) , point source , physics , composite material
The divergence and intensity distribution of X‐rays transported through a conical‐type X‐ray guide tube (XGT) were measured. Diverging X‐rays from a point source were condensed by use of the conical‐type XGT. The parallelism of X‐rays through the XGT was better than that encountered for a cylindrical‐type XGT proposed previously [Nakazawa (1983). J. Appl. Cryst. 16 , 239–241]. The intensity of the X‐ray beam around the central axis of the conical‐type XGT was exceedingly high in comparison with that measured without the tube and almost uniform over a cross‐sectional area 60 μm in diameter. The high intensity provides the possibility of performing diffraction experiments with crystals as small as 20 μm in diameter with a conventional X‐ray diffraction system.