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A Kossel camera designed for the cameca electron probe microanalyser
Author(s) -
Maurice F.,
Philibert J.,
Seguin R.,
Tixier R.
Publication year - 1975
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889875010473
Subject(s) - materials science , reflection (computer programming) , professional video camera , electron , optics , physics , computer science , nuclear physics , telecommunications , programming language , high definition television
The camera described is built as an attachment for the Cameca electron probe microanalyser, interchangeable with the standard specimen‐stage drawer. It can be used for transmission‐pattern recording, or by the incorporation of a special specimen holder, for back‐reflection patterns. In both modes, films are kept in air and are parallel to the specimen surface. The features incorporated in this camera, associated with computer calculations of an analytical treatment of the patterns, take full advantage of Kossel patterns, as a very easy to use, very fast and very accurate X‐ray crystallographic technique.