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With the ever-increasing operating frequency in integrated circuit, it is very essentialto assess the radiation used to help the IC designer. Based on the similarity of electromagnetic patterns obtained from the radiation of ICs and their nonlinear edge, we develop a post-processing technique to group the electromagnetic patterns. A near field scanning is performed to obtain and extract the electromagnetic pattern that is used to validate the technique. Experiment results show that it can accurately group the electromagnetic patterns by which radiation assessment can be performed.

An EMI radiation grouping approach based on spectral cluster in near filed scanning for assessment