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Single Event Effects (SEEs) - predominately bit-flips in electronics causedby particle interactions - are a major concern for ASICs operated in highradiation environments such as ABCStar ASICs, which are designed to be used inthe future ATLAS ITk strip tracker. The chip design is therefore optimised toprotect it from SEEs by implementing triplication techniques such as TripleModular Redundancy (TMR). In order to verify the radiation protectionmechanisms of the chip design, the cross-section for Single Event Upsets(SEUs), a particular class of SEEs, is measured by exposing the chip tohigh-intensity particle beams while monitoring it for observed SEUs. This studypresents the setup, the performed measurements, and the results from SEU testsperformed using the latest version of the ABCStar ASIC (ABCStar V1) using a 480MeV proton beam.

journal of instrumentation

A Starry Byte -- proton beam measurements of single event upsets and  other radiation effects in ABCStar ASIC Versions 0 and 1 for the ITk strip  tracker