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The von Hámos spectrometer setup at the HED instrument of   the European XFEL is described in detail. The spectrometer is   designed to be operated primarily between 5 and 15 keV to   complement the operating photon energy range of the HED   instrument. Four Highly Annealed Pyrolitic Graphite (HAPG) crystals   are characterised with thicknesses of 40 μm or 100 μm   and radius-of-curvature 50 mm or 80 mm, in conjunction with either   an ePix100 or Jungfrau detector. The achieved resolution with the   50 mm crystals, operated between 6.5 and 9 keV, matches that   reported previously: ∼8 eV for a thickness of 40 μm,   whereas, with an 80 mm crystal of thickness 40 μm, the   resolution exceeds that expected. Namely, a resolution of 2 eV is   demonstrated between 5–6 keV implying a resolving power of   2800. Therefore, we posit that flatter HAPG crystals, with their   high reflectivity and improved resolving power, are a powerful tool   for hard x-ray scattering and emission experiments allowing   unprecedented measurements of collective scattering in a single   shot.

Design and performance characterisation of the HAPG von Hámos Spectrometer at the High Energy Density Instrument of the European XFEL